Semiconductor

GJ CNC automatic measuring eqiupment

◎Equipment overview

This equipment is a fully automaticRobotbased on non-contact optics, and uses optical measurement to measure the relevantXYZdimensions that need to be controlled in the semiconductor process.XY control platform andZ-axis image autofocus, CCD Aligner-and-Robot Load on Loadto overcome the-Wafer -deformation and warping,and-SECSwill greatly improve the measurement efficiency.

◎Measurement object

Object:Si Wafer , thinning-Wafer

◎Equipment setting environment

The equipment installation place is a clean room(Class 100).

Temperature:22 ± 3    Temperature change:maximum to1.1/min

Humidity:No condensation. (Recommended Environment: Relative Humidity:50%)

Vibration//Acceleration: There is no vibration and shock when the equipment is in operation (recommended-environment

0.05G-or less、Amplitude:5μ m-or less)

Floor flatness:<20mm/equipment setting area

Floor withstand load:>1000kg/mi

◎Equipment Specifications* Layout